ДСТУ CR 10320:2014 Оптический эмиссионный анализ низколегированных сталей (стандартный метод). Метод определения C, Si, S, P, Mn, Cr, Ni и Cu (CR 10320:2004, IDT)

ДСТУ CR 10320:2014
(CR 10320:2004, IDT)

Оптичний емісійний аналіз низьколегованих сталей (стандартний метод).
Метод визначення C, Si, S, P, Mn, Cr, Ni та Cu

 
 
 
     
Не є офіційним виданням.
Офіційне видання розповсюджує національний орган стандартизації
(ДП «УкрНДНЦ» http://uas.gov.ua)

Contents

Foreword

1 Scope

2 Test sample preparation

3 Calibration of the instrument

3.1 Determination of calibration curve

3.2 Linear correlation

3.3 Quadratic correlation

3.4 Confidence limit (Syc) and standard error (Syx) in a linear correlation

3.5 Confidence limit (Syc) and standard error (Syx) in a quadratic correlation

3.6 Correlation accuracy

4 Calculation of interferences

4.1 Spectral interferences

4.2 Matrix interferences

4.3 Calculation of an interfered element due to either matrix effect or spectral interference

5 Determination of performance criteria

5.1 Determination of background equivalent concentration ВЕС

5.2 Determination of detection limit DL

5.3 Determination of repeatability as relative standard deviation RSD

5.4 Determination of accuracy SEA

6 Performing analysis

7 Ordinary maintenance

8 Quality control

8.1 Control chart

8.2 Calibration curve control

9 Examples

9.1 Determination of calibration curve

9.2 Calculation of interferences

9.3 Determination of background equivalent concentration

9.4 Determination of detection limit

9.5 Determination of repeatability

9.6 Determination of accuracy

9.7 Ordinary maintenance

9.8 Control CHART

9.9 Calibration curve control

10 Statistical results

Annex A Optical emission spectrometry

Bibliography