ДСТУ CLC/TS 50466:2022 Довготривале зберігання електронних компонентів. Технічні умови для впровадження (CLC/TS 50466:2006, IDT)

ДСТУ CLC/TS 50466:2022
(CLC/TS 50466:2006, IDT)

Довготривале зберігання електронних компонентів.
Технічні умови для впровадження

 
   
 
 
     
Не є офіційним виданням.
Офіційне видання розповсюджує національний орган стандартизації
(ДП «УкрНДНЦ» http://uas.gov.ua)

Contents

1 General

2 Normative references

3 Storage decision criteria

3.1 Advantages of storage

3.1.1 Technical simplicity - Rapidity

3.1.2 Solution durability

3.1.3 Preventive storage

3.2 Hazards - Drawbacks

3.2.1 Generic aging hazard

3.2.2 Poor stock dimensioning

3.2.3 Incorrect control of reliability during storage

3.2.4 Freezing equipment functionalities

3.3 Storage cost (Annex C)

3.4 Decision criteria

4 Purchasing procurement

4.1 List of components

4.2 Quantity of components to be stored

4.2.1 Production stock

4.2.2 Field service stock

4.3 When is it worth keeping in stock?

4.4 Procurement recommendations

5 Technical validation of the components

5.1 Purpose

5.2 Relevant field

5.3 Test selection criteria

5.4 Measurements and tests

5.4.1 Sampling

5.4.2 Visual examination, sealing, solderability

5.4.3 Compliance with the electrical specifications

5.4.3.1 Measurement of electrical parameters

5.4.3.2 Temperature impact

5.4.4 Assessment of the supplied batch reliability

5.4.5 Manufacturing control check (technological analysis)

5.5 Sanction

6 Conditioning and storage

6.1 Type of environment

6.2 Elementary storage unit

6.3 Stock management

6.4 Redundancy

6.5 Identification - Traceability

6.6 Initial packaging

6.7 Solderability

6.8 Stabilization bake

6.9 Storage conditions

6.9.1 Storage area

6.9.2 Temperature

6.9.3 Temperature variations

6.9.4 Relative humidity - Chemical attacks - Contamination

6.9.5 Pressure

6.9.6 Electrostatic discharges

6.9.7 Vibrations - Mechanical impacts

6.9.8 Electromagnetic field - Radiation

6.9.9 Light

6.10 Maintaining storage conditions

7 Periodic check of the components

7.1 Objectives

7.2 Periodicity

7.3 Tests during periodic check

8 De-stocking

8.1 Precautions

8.1.1 Electrostatic discharges

8.1.2 Mechanical impacts

8.2 Inspection

9 Feedback

Annex A - Example related to components

A.1 Example of a component list

A.2 Data description

Annex B - Examples of periodic and/or destocking tests

Annex C - Parameters influencing the final price of the component storage

Annex D - Parameters influencing the quantity of the components to be stored

Annex E - Failure mechanisms - Hermetically encapsulated and non-encapsulated active components

Annex F - Failure mechanisms: GaAs components

Bibliography