ДСТУ EN IEC 60749-28:2022 Полупроводниковые приборы. Методы механических и климатических испытаний. Часть 28. Испытание на чувствительность к электростатическому разряду (ESD). Модель заряженного устройства (...



ДСТУ EN IEC 60749-28:2022
(EN IEC 60749-28:2022, IDT; IEC 60749-28:2022, IDT)

Напівпровідникові прилади. Методи механічних і кліматичних випробувань.
Частина 28. Випробування на чутливість до електростатичного розряду (ESD).
Модель зарядженого пристрою (CDM) - рівень пристрою

 
   
 
 
     
Не є офіційним виданням.
Офіційне видання розповсюджує національний орган стандартизації
(ДП «УкрНДНЦ» http://uas.gov.ua)

CONTENTS

FOREWORD

INTRODUCTION

1 Scope

2 Normative references

3 Terms and definitions

4 Required equipment

4.1 CDM ESD tester

4.2 Waveform measurement equipment

4.3 Verification modules (metal discs)

4.4 Capacitance meter

4.5 Ohmmeter

5 Periodic tester qualification, waveform records, and waveform verification requirements

5.1 Overview of required CDM tester evaluations

5.2 Waveform capture hardware

5.3 Waveform capture setup

5.4 Waveform capture procedure

5.5 CDM tester qualification/requalification procedure

5.6 CDM tester quarterly and routine waveform verification procedure

5.7 Waveform characteristics

5.8 Documentation

5.9 Procedure for evaluating full CDM tester charging of a device

6 CDM ESD testing requirements and procedures

6.1 Tester and device preparation

6.2 Test requirements

6.3 Test procedures

6.4 CDM test recording / reporting guidelines

6.5 Testing of Devices in Small Packages

7 CDM classification criteri

Annex A (normative) Verification module (metal disc) specifications and cleaning guidelines for verification modules and testers

Annex B (normative) Capacitance measurement of verification modules (metal discs) sitting on a tester field plate dielectric

Annex C (normative) Testing of small package integrated circuits and discrete semiconductors (ICDS)

Annex D (informative) CDM test hardware and metrology improvements

Annex E (informative) CDM tester electrical schematic

Annex F (informative) Sample oscilloscope setup and waveform

Annex G (informative) Field-induced CDM tester discharge procedures

Annex H (informative) Waveform verification procedures

Annex I (informative) Determining the appropriate charge delay for full charging of a large module or device

Annex J (informative) Electrostatic discharge (ESD) sensitivity testing direct contact charged device model (DC-CDM)

Bibliography